Hayama, K.K.HayamaOhyama, H.H.OhyamaTakakura, K.K.TakakuraSimoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaClaeys, CorCorClaeys2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9003Effect of high-temperature electron irradiation in deep submicron MOSFETsProceedings paper