Correlated X-Ray and Electron Microscopies of a Single Biphasic GaAs Nanowire

Dursap, ThomasThomasDursapZhou, TaoTaoZhouDupraz, MaximeMaximeDuprazLabat, StephaneStephaneLabatThomas, OlivierOlivierThomasFardeau, NielsNielsFardeauRegreny, PhilippePhilippeRegrenyGendry, MichelMichelGendryBrottet, SoleneSoleneBrottetBlanchard, Nicholas P.Nicholas P.BlanchardHolt, Martin V.Martin V.HoltRichard, Marie-IngridMarie-IngridRichardDanescu, AlexandruAlexandruDanescuPenuelas, JoseJosePenuelasBugnet, MatthieuMatthieuBugnet2025-08-182025-08-182025-AUG 72366-9608WOS:001546154000001https://imec-publications.be/handle/20.500.12860/46093Correlated X-Ray and Electron Microscopies of a Single Biphasic GaAs NanowireJournal article10.1002/smtd.202500740WOS:001546154000001STRAINSURFACESEMICONDUCTORSZINCBLENDEDYNAMICSWURTZITEGROWTHMEDLINE:40772372