Simicic, MarkoMarkoSimicicPutcha, VamsiVamsiPutchaParvais, BertrandBertrandParvaisWeckx, PieterPieterWeckxKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroesenekenGielen, GeorgesGeorgesGielenLinten, DimitriDimitriLintenThean, AaronAaronThean2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25906MOSFET variability and reliability characterization arrayMeeting abstracthttp://www.iirw.org/fileadmin/user_upload/2015_9_18_IIRW_2015_TPC_Schedule.pdf