Clarysse, TrudoTrudoClarysseBrammertz, GuyGuyBrammertzVanhaeren, DanielleDanielleVanhaerenEyben, PierrePierreEybenGoossens, JozefienJozefienGoossensClemente, FrancescaFrancescaClementeMeuris, MarcMarcMeurisVandervorst, WilfriedWilfriedVandervorstSrnanek, RudolfRudolfSrnanekKinder, RudolfRudolfKinderSciana, B.B.ScianaRadziewicz, D.D.RadziewiczLi, ZhiqiangZhiqiangLi2021-10-172021-10-1720081369-8001https://imec-publications.be/handle/20.500.12860/13540Accurate carrier profiling of n-type GaAs junctionsJournal article