Amat, EsteveEsteveAmatMartin Martinez, JavierJavierMartin MartinezBargallo Gonzalez, MireiaMireiaBargallo GonzalezRodriguez, RosanaRosanaRodriguezNafria, MontseMontseNafriaSimoen, EddyEddySimoenVerheyen, PeterPeterVerheyenAymerich, XavierXavierAymerich2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/16651Processing dependences of CHC degradation on strained-Si pMOSFETsMeeting abstract