Firrincieli, AndreaAndreaFirrincieliGupta, SuyogSuyogGuptaVincent, BenjaminBenjaminVincentGencarelli, FedericaFedericaGencarelliLin, DennisDennisLinSimoen, EddyEddySimoenVandervorst, WilfriedWilfriedVandervorstClaeys, CorCorClaeysSaraswat, K.K.SaraswatKittl, JorgeJorgeKittl2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20680Characterization of Al/Ti and NiGe ohmic contacts to n-type GeSn CVD-grown layersMeeting abstract