Yoshida, S.S.YoshidaTaniguchi, S.S.TaniguchiMinari, HidekiHidekiMinariLin, DennisDennisLinIvanov, TsvetanTsvetanIvanovWatanabe, H.H.WatanabeNakazawa, MasashiMasashiNakazawaCollaert, NadineNadineCollaertThean, AaronAaronThean2021-10-232021-10-232015https://imec-publications.be/handle/20.500.12860/26220The impact of energy barrier height on border traps in III-V gate stacksProceedings paper