Process-induced V-t variability in nanoscale FinFETs: Does V-t extraction methods have any impact?

Bhoir, Mandar S.Mandar S.BhoirChiarella, ThomasThomasChiarellaRagnarsson, Lars A.Lars A.RagnarssonMitard, JeromeJeromeMitardHoriguchi, NaotoNaotoHoriguchiMohapatra, Nihar R.Nihar R.Mohapatra2022-01-202021-11-022022-01-202020naWOS:000610825100013https://imec-publications.be/handle/20.500.12860/38240Process-induced V-t variability in nanoscale FinFETs: Does V-t extraction methods have any impact?Proceedings paper978-1-7281-2539-8WOS:000610825100013