Croon, JeroenJeroenCroonRosmeulen, MaartenMaartenRosmeulenDecoutere, StefaanStefaanDecoutereSansen, WillyWillySansenMaes, HermanHermanMaes2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4224A simple and accurate deep submicron mismatch modelProceedings paper