Stockman, ArnoArnoStockmanCanato, E.E.CanatoTajalli, A.A.TajalliMeneghini, M.M.MeneghiniMeneghesso, G.G.MeneghessoZanoni, E.E.ZanoniMoens, P.P.MoensBakeroot, BenoitBenoitBakeroot2021-10-262021-10-262018https://imec-publications.be/handle/20.500.12860/31859On the origin of the leakage current in p-gate AlGaN/GaN HEMTsProceedings paperhttps://ieeexplore.ieee.org/document/8353582/