Investigation of trapping effects on Au-free AlGaN/GaN Schottky diodes fabricated on C-doped buffer layers

Hu, JieJieHuStoffels, SteveSteveStoffelsLenci, SilviaSilviaLenciYou, ShuzhenShuzhenYouBakeroot, BenoitBenoitBakerootRonchi, NicoloNicoloRonchiVenegas, RafaelRafaelVenegasGroeseneken, GuidoGuidoGroesenekenDecoutere, StefaanStefaanDecoutere2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25400Investigation of trapping effects on Au-free AlGaN/GaN Schottky diodes fabricated on C-doped buffer layersMeeting abstract