New shift-&-ratio Leff extraction algorithm for fully-depleted SOI CMOS transistors

van Meer, HansHansvan MeerDe Meyer, KristinKristinDe Meyer2021-10-142021-10-142000https://imec-publications.be/handle/20.500.12860/4840New shift-&-ratio Leff extraction algorithm for fully-depleted SOI CMOS transistorsProceedings paper