Effect of mechanical strain on 1/f noise in metal-oxide semiconductor field-effect transistors

Lim, Ji-SongJi-SongLimAcosta, AntonioAntonioAcostaThompson, Scott E.Scott E.ThompsonBosman, Gijs E.Gijs E.BosmanSimoen, EddyEddySimoenNishida, ToshikazuToshikazuNishida2021-10-182021-10-1820090021-8979https://imec-publications.be/handle/20.500.12860/15720Effect of mechanical strain on 1/f noise in metal-oxide semiconductor field-effect transistorsJournal article