Parametric and functional degradation analysis of complete 14-nm FinFET SRAM

Kraak, DanielDanielKraakAgbo, InnocentInnocentAgboTaouil, MottaMottaTaouilHamdioui, SaidSaidHamdiouiWeckx, PieterPieterWeckxCosemans, StefanStefanCosemansCatthoor, FranckyFranckyCatthoor2021-10-272021-10-2720191063-8210https://imec-publications.be/handle/20.500.12860/33329Parametric and functional degradation analysis of complete 14-nm FinFET SRAMJournal articlehttps://ieeexplore.ieee.org/document/8678671