Wu, Tian-LiTian-LiWuMarcon, DenisDenisMarconZahid, MohammedMohammedZahidVan Hove, MarleenMarleenVan HoveStoffels, SteveSteveStoffelsSrivastava, PuneetPuneetSrivastavaDecoutere, StefaanStefaanDecoutereGroeseneken, GuidoGuidoGroeseneken2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21864Forward gate bias on-state stress on AlGaN/GaN MIS-HEMTs for power switching applicationsMeeting abstract