Tallarico, A. N.A. N.TallaricoMillesimo, M.M.MillesimoBorga, MatteoMatteoBorgaBakeroot, BenoitBenoitBakerootPosthuma, NielsNielsPosthumaCosnier, T.T.CosnierDecoutere, StefaanStefaanDecoutereSangiorgi, E.E.SangiorgiFiegna, C.C.Fiegna2024-11-252024-09-292024-11-2520240741-3106WOS:001302508200015https://imec-publications.be/handle/20.500.12860/44584P-GaN Gate HEMTs: A Solution to Improve the High-Temperature Gate LifetimeJournal article10.1109/LED.2024.3424563WOS:001302508200015RELIABILITYFREQUENCYBREAKDOWN