Severi, SimoneSimoneSeveriPawlak, BartekBartekPawlakDuffy, RayRayDuffyAugendre, EmmanuelEmmanuelAugendreHenson, KirklenKirklenHensonLindsay, RichardRichardLindsayDe Meyer, KristinKristinDe Meyer2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12880Arsenic junction thermal stability and high-dose boron-pocket activation during SPER in nMOS transistorsJournal article