Ren, PengpengPengpengRenGao, R.R.GaoJi, ZhigangZhigangJiArimura, HiroakiHiroakiArimuraZhang, J. F.J. F.ZhangWang, R.R.WangDuan, M.M.DuanZhang, W.W.ZhangFranco, JacopoJacopoFrancoSioncke, SonjaSonjaSionckeCott, DaireDaireCottMitard, JeromeJeromeMitardWitters, LiesbethLiesbethWittersMertens, HansHansMertensKaczer, BenBenKaczerMocuta, AndaAndaMocutaCollaert, NadineNadineCollaertLinten, DimitriDimitriLintenHuang, R.R.HuangThean, AaronAaronTheanGroeseneken, GuidoGuidoGroeseneken2021-10-232021-10-232016https://imec-publications.be/handle/20.500.12860/27204Understanding charge traps for optimizing Si-passivated Ge nMOSFETsProceedings paperhttp://ieeexplore.ieee.org/document/7573367/?tp=&arnumber=7573367