Oliveira, A.V.A.V.OliveiraAgopian, P.G.D.P.G.D.AgopianMartino, J.A.J.A.MartinoFang, WenWenFangArimura, HiroakiHiroakiArimuraMitard, JeromeJeromeMitardMertens, HansHansMertensSimoen, EddyEddySimoenMocuta, AndaAndaMocutaCollaert, NadineNadineCollaertThean, AaronAaronTheanClaeys, CorCorClaeys2021-10-222021-10-222015https://imec-publications.be/handle/20.500.12860/25704Impact of gate stack dielectric on intrinsic voltage gain and low frequency noise in Ge pMOSFETsProceedings paperhttps://doi.org/10.1149/06605.0309ecst