Gaubas, EugenijusEugenijusGaubasVanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenClaeys, CorCorClaeysSeifert, W.W.Seifert2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1891Study of oxygen related recombination defects in Si by temperature-dependent lifetime and EBIC measurementsProceedings paper