Put, SofieSofiePutMehta, HarshHarshMehtaCollaert, NadineNadineCollaertVan Uffelen, M.M.Van UffelenLeroux, P.P.LerouxSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-182021-10-182009https://imec-publications.be/handle/20.500.12860/16062Effect of rotation, gate-dielectric and SEG on the noiseProceedings paper