Fedina, L.L.FedinaGutakovskii, A.A.GutakovskiiAseev, A.A.AseevVan Landuyt, J.J.Van LanduytVanhellemont, JanJanVanhellemont2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1880New intermediate defect configuration in Si studie by in situ HREM irradiationProceedings paper