Oliveira, AlbertoAlbertoOliveiraSimoen, EddyEddySimoenMitard, JeromeJeromeMitardAgopian, Gaula G.D.Gaula G.D.AgopianMartino, Joao AntonioJoao AntonioMartinoLanger, RobertRobertLangerWitters, LiesbethLiesbethWittersCollaert, NadineNadineCollaertThean, AaronAaronTheanClaeys, CorCorClaeys2021-10-232021-10-2320160018-9383https://imec-publications.be/handle/20.500.12860/27095Low-frequency noise assessment of different Ge pFinFET STI processesJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7546857