Kilchytska, V.V.KilchytskaAlvarado, J.J.AlvaradoCollaert, NadineNadineCollaertRooyackers, RitaRitaRooyackersMilitaru, O.O.MilitaruBerger, G.G.BergerFlandre, D.D.Flandre2021-10-182021-10-1820100018-9499https://imec-publications.be/handle/20.500.12860/17367Total-dose effects caused by high-energy neutrons and gamma-rays in multiple-gate FETsJournal article