Lukyanchikova, N. B.N. B.LukyanchikovaPetrichuk, M. V.M. V.PetrichukGarbar, N. P.N. P.GarbarSimoen, EddyEddySimoenClaeys, C.C.Claeys2021-09-292021-09-291995https://imec-publications.be/handle/20.500.12860/738Low-frequency noise characterisation of silicon-on-insulator depletion mode pMOSFETsProceedings paper