Toledano Luque, MariaMariaToledano LuqueKaczer, BenBenKaczerRoussel, PhilippePhilippeRousselGrasser, TiborTiborGrasserWirth, G.I.G.I.WirthFranco, JacopoJacopoFrancoVrancken, ChristaChristaVranckenHoriguchi, NaotoNaotoHoriguchiGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-192011https://imec-publications.be/handle/20.500.12860/19899Response of a single trap to AC negative bias temperature stressProceedings paper