Padovani, AndreaAndreaPadovaniArreghini, AntonioAntonioArreghiniVandelli, LucaLucaVandelliLarcher, LucaLucaLarcherVan den Bosch, GeertGeertVan den BoschPavan, PaoloPaoloPavanVan Houdt, JanJanVan Houdt2021-10-192021-10-1920110018-9383https://imec-publications.be/handle/20.500.12860/19531A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulationsJournal article