Development of a dedicated software for the quantification of two-dimensional high vacuum scanning spreading resistance microscopy measurements

Eyben, PierrePierreEybenClarysse, TrudoTrudoClarysseSchulze, AndreasAndreasSchulzeNazir, AftabAftabNazirVandervorst, WilfriedWilfriedVandervorst2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/20666Development of a dedicated software for the quantification of two-dimensional high vacuum scanning spreading resistance microscopy measurementsOral presentation