Impact of device architecture and gate stack processing on the low-frequency noise of silicon nanowire transistors

Simoen, EddyEddySimoenOliveira, Alberto ViniciusAlberto ViniciusOliveiraVeloso, AnabelaAnabelaVelosoVaisman Chasin, AdrianAdrianVaisman ChasinRitzenthaler, RomainRomainRitzenthalerMertens, HansHansMertensHoriguchi, NaotoNaotoHoriguchiClaeys, CorCorClaeys2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/34009Impact of device architecture and gate stack processing on the low-frequency noise of silicon nanowire transistorsProceedings paperhttps://ieeexplore.ieee.org/document/8983679