Dey, BappadityaBappadityaDeyPrasad, AmitAmitPrasadBelgharat, AyaAyaBelgharatBlanco, VictorVictorBlancoHalder, SandipSandipHalder2025-07-282025-07-282025978-1-5106-8638-00277-786XWOS:001514426300108https://imec-publications.be/handle/20.500.12860/45965Towards Robust Defect Inspection in Advanced Node Semiconductors via Continual LearningProceedings paper10.1117/12.3052286978-1-5106-8639-7WOS:001514426300108