Chen, Shih-HungShih-HungChenLinten, DimitriDimitriLintenHellings, GeertGeertHellingsScholz, MirkoMirkoScholzGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-212013https://imec-publications.be/handle/20.500.12860/22128Emerging challenges of ESD protections in FinFET technologiesProceedings paper