Hantschel, ThomasThomasHantschelTrenkler, ThomasThomasTrenklerVandervorst, WilfriedWilfriedVandervorstMalavé, A.A.MalavéBüchel, D.D.BüchelKulisch, W.W.KulischOesterschulze, E.E.Oesterschulze2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3489Tip-on-tip: a novel AFM tip configuration for the electrical characterization of semiconductor devicesJournal article