Probabilistic defect occupancy model for NBTI

Martin-Martinez, JavierJavierMartin-MartinezKaczer, BenBenKaczerToledano Luque, MariaMariaToledano LuqueRodriguez, RosanaRosanaRodriguezNafria, MonseratMonseratNafriaAymerich, X.X.AymerichGroeseneken, GuidoGuidoGroeseneken2021-10-192021-10-192011-04https://imec-publications.be/handle/20.500.12860/19398Probabilistic defect occupancy model for NBTIProceedings paper