Boubaaya, MMBoubaayaO'Sullivan, BarryBarryO'SullivanDjezzar, BBDjezzarFranco, JacopoJacopoFrancoDentoni Litta, EugenioEugenioDentoni LittaRitzenthaler, RomainRomainRitzenthalerDupuy, EmmanuelEmmanuelDupuyMachkaoutsan, VladimirVladimirMachkaoutsanFazan, PierrePierreFazanKim, C.C.KimBenaceur-Doumaz, D.D.Benaceur-DoumazFerhat Hamida, A.A.Ferhat HamidaSpessot, AlessioAlessioSpessotLinten, DimitriDimitriLintenHoriguchi, NaotoNaotoHoriguchi2021-10-282021-10-2820201530-4388https://imec-publications.be/handle/20.500.12860/34814Impact of dimensions of memory periphery FinFETs on bias temperature instabilityJournal articlehttps://ieeexplore.ieee.org/document/9052659