Magnone, P.P.MagnoneCrupi, F.F.CrupiGiusi, G.G.GiusiPace, C.C.PaceSimoen, EddyEddySimoenClaeys, CorCorClaeysPantisano, LuigiLuigiPantisanoMaji, D.D.MajiRao, V.R.V.R.RaoSrinivasan, P.P.Srinivasan2021-10-182021-10-1820091530-4388https://imec-publications.be/handle/20.500.12860/157851/f Noise in drain and gate current of MOSFETs with high-k gate stacksJournal article