Thoelen, R.R.ThoelenDaenen, M.M.DaenenWilliams, O.A.O.A.WilliamsVermeeren, V.V.VermeerenGielen, E.E.GielenHellings, N.N.HellingsHaenen, KenKenHaenenManca, JeanJeanMancaWagner, P.P.WagnerAmeloot, M.M.AmelootMichiels, L.L.MichielsvandeVen, M.M.vandeVen2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/11309Surface characterization using TIRF microscopyOral presentation