Faster ESD device characterization with wafer-level HBM

Scholz, MirkoMirkoScholzTremouilles, DavidDavidTremouillesLinten, DimitriDimitriLintenRolain, YvesYvesRolainPintelon, RikRikPintelonSawada, MasanoriMasanoriSawadaNakaei, TakumiTakumiNakaeiHasebe, T.T.HasebeGroeseneken, GuidoGuidoGroeseneken2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12858Faster ESD device characterization with wafer-level HBMProceedings paper