Lee, KookjinKookjinLeeJi, HyunjinHyunjinJiKim, YangheeYangheeKimKaczer, BenBenKaczerLee, HyebinHyebinLeeAhn, Jae-PyoungJae-PyoungAhnChoi, JunheeJunheeChoiGrill, AlexanderAlexanderGrillPanarella, LucaLucaPanarellaSmets, QuentinQuentinSmetsVerreck, DevinDevinVerreckVan Beek, SimonSimonVan BeekVaisman Chasin, AdrianAdrianVaisman ChasinLinten, DimitriDimitriLintenNa, JunhongJunhongNaLee, Jae WooJae WooLeeDe Wolf, IngridIngridDe WolfKim, Gyu-TaeGyu-TaeKim2023-08-212023-06-202023-08-2120222196-7350WOS:000751745300001https://imec-publications.be/handle/20.500.12860/41925Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias ApplicationsJournal article10.1002/admi.202102488WOS:000751745300001TRANSPORT-PROPERTIESLARGE-AREAMOS2MONODEFECTS