Guo, WeiWeiGuoNicholas, GarethGarethNicholasKaczer, BenBenKaczerTodi, RaviRaviTodiDe Jaeger, BriceBriceDe JaegerClaeys, CorCorClaeysMercha, AbdelkarimAbdelkarimMerchaSimoen, EddyEddySimoenCretu, B.B.CretuRoutoure, J.M.J.M.RoutoureCarin, R.R.Carin2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12240Low-frequency noise assessment of silicon passivated Ge pMOSFETs with TiN/TaN/HfO2 gate stackJournal article