Toledano Luque, MariaMariaToledano LuqueKaczer, BenBenKaczerGrasser, TiborTiborGrasserRoussel, PhilippePhilippeRousselFranco, JacopoJacopoFrancoGroeseneken, GuidoGuidoGroeseneken2021-10-212021-10-2120131071-1023https://imec-publications.be/handle/20.500.12860/23177Toward a streamlined projection of small device BTI lifetime distributionsJournal article