Cho, Moon JuMoon JuChoBury, ErikErikBuryKaczer, BenBenKaczerGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23651Channel hot carrier degradation and self-heating effects in FinFETsBook chapterhttp://rd.springer.com/chapter/10.1007/978-3-319-08994-2_10