Extended-defect aspects on Ge-on-Si materials and devices

Simoen, EddyEddySimoenEneman, GeertGeertEnemanWang, GangGangWangSouriau, LaurentLaurentSouriauLoo, RogerRogerLooCaymax, MattyMattyCaymaxClaeys, CorCorClaeys2021-10-182021-10-1820090013-4651https://imec-publications.be/handle/20.500.12860/16230Extended-defect aspects on Ge-on-Si materials and devicesJournal article