Tsiara, ArtemisiaArtemisiaTsiaraSrinivasan, AshwynAshwynSrinivasanBalakrishnan, SadhishkumarSadhishkumarBalakrishnanPantouvaki, MariannaMariannaPantouvakiAbsil, PhilippePhilippeAbsilVan Campenhout, JorisJorisVan CampenhoutCroes, KristofKristofCroes2021-12-082021-11-022021-12-082020naWOS:000676346200057https://imec-publications.be/handle/20.500.12860/37646Electrical and Optical Reliability Analysis of GeSi Electro-Absorption ModulatorsProceedings paper978-1-9435-8071-2WOS:000676346200057SILICON PHOTONICS