Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors

Lukyanchikova, N.N.LukyanchikovaGarbar, N.N.GarbarSmolanka, A.A.SmolankaLokshin, M.M.LokshinLee, Shih ChungShih ChungLeeSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10810Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistorsProceedings paper