Franco, JacopoJacopoFrancoKaczer, BenBenKaczerWaldron, NiamhNiamhWaldronRoussel, PhilippePhilippeRousselAlian, AliRezaAliRezaAlianPourghaderi, Mohammad AliMohammad AliPourghaderiJi, ZhigangZhigangJiGrasser, TiborTiborGrasserKauerauf, ThomasThomasKaueraufSioncke, SonjaSonjaSionckeCollaert, NadineNadineCollaertThean, AaronAaronTheanGroeseneken, GuidoGuidoGroeseneken2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23832RTN and PBTI-induced time-dependent variability of replacement metal-gate high-k InGaAs FinFETsProceedings paper