Characterization and modeling of charge trapping: From single defects to devices

Grasser, T.T.GrasserRzepa, G.G.RzepaWaltl, M.M.WaltlGoes, W.W.GoesRott, K.K.RottRott, G.G.RottReisinger, H.H.ReisingerFranco, JacopoJacopoFrancoKaczer, BenBenKaczer2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/23881Characterization and modeling of charge trapping: From single defects to devicesProceedings paperhttp://dx.doi.org/10.1109/ICICDT.2014.6838620