Hakata, T.T.HakataOhyama, HidenoriHidenoriOhyamaKobayashi, K.K.KobayashiSimoen, EddyEddySimoenClaeys, CorCorClaeysTakami, Y.Y.TakamiSunaga, H.H.SunagaMiyahara, K.K.Miyahara2021-10-062021-10-061999https://imec-publications.be/handle/20.500.12860/3483Radiation effect on metal-contaminated Si diodesJournal article