Monta, KazukiKazukiMontaKatselas, LeonidasLeonidasKatselasFodor, FerencFerencFodorMiki, TakujiTakujiMikiHatzopoulos, AlkisAlkisHatzopoulosNagata, MakotoMakotoNagataMarinissen, Erik JanErik JanMarinissen2022-12-012022-09-162022-12-0120222168-2356WOS:000850868500014https://imec-publications.be/handle/20.500.12860/40435Testing Embedded Toggle Generation Through On-Chip IR-Drop MeasurementsJournal article10.1109/MDAT.2022.3178050WOS:000850868500014