Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM Capacitors

Lee, SumiSumiLeeRonchi, NicoloNicoloRonchiBizindavyi, JasperJasperBizindavyiPopovici, Mihaela IoanaMihaela IoanaPopoviciBanerjee, KaustuvKaustuvBanerjeeWalke, AmeyAmeyWalkeDelhougne, RomainRomainDelhougneVan Houdt, JanJanVan HoudtShin, ChanghwanChanghwanShin2023-07-252023-04-152023-07-2520230018-9383WOS:000958834500001https://imec-publications.be/handle/20.500.12860/41455Analysis of Wake-Up Reversal Behavior Induced by Imprint in La:HZO MFM CapacitorsJournal article10.1109/TED.2023.3254509WOS:000958834500001FIELD-CYCLING BEHAVIOR