Al-Kofahi, I. S.I. S.Al-KofahiZhang, JennyJennyZhangGroeseneken, GuidoGuidoGroeseneken2021-09-302021-09-301997https://imec-publications.be/handle/20.500.12860/1694Continuing degradation of the SiO2/Si interface after hot hole stressJournal article